- Original Title: VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
- ISBN: 9783642420238
- EAN: 3642420238
- Language: en
- Pages count: 388
- Release date: 08.03.2013
- Book format : pdf epub mobi fb2 djvu doc txt mp3 torrent
- Size File: 13.91Mb
- Quality: Scanned
- OS: WinXP
- Illustration: No
- Book rating: 3.5 out of 5 (273 votes)
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